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Molecular Metrology, Inc. Designs and manufactures x-ray scattering equipment, including complete instruments for small angle mode and two dimensional detectors. Includes specifications of systems and components, at Northampton, Massachusetts. Area Detector Systems Corporation Manufacturer of CCD detectors, particularly in the X-ray range. Includes specifications, certification and technical support from Poway, California. Mettler-Toledo Thermal Analysis Comprising the differential scanning calorimeter, thermogravimetric, thermomechanical and dynamic mechanical analyzers. Contacts based in Leicester, England. Oxford Microbeams Ltd. Non-destructive, trace elemental analysis, ion beam analysis using a focused microbeam. Includes applications in tomography and microfabrication, downloads and contacts in England. Physical Electronics, Inc. Surface analysis instrumentation, including: AES, ESCA, TOF-SIMS and D-SIMS based instrumentation. Axic, Inc. Manufactures and distributes semiconductor plasma processing equipment and thin film metrology tools for the semiconductor, III-V compound semiconductor, optics, photonics, optoelectronics, nanotechnology and micro electromechanical system (MEMS) industries. Includes product overview, contacts for technical support, worldwide distribution and location map of Santa Clara, California. Innova Air Tech Instruments A/S Manufacturing systems for measurements in anaesthetic gas monitoring, fermentation monitoring, tracer gas, photoacoustic, ventilation and thermal comfort. Includes applications, publications, distribution from Ballerup, Denmark. Dacell Co., Ltd. Manufactures load cell, torque sensor, pressure sensor, torque wrench, LVDT, multi-layer inclinometer and digital indicator in Chung-Buk, Korea. Cybertechnologies USA Manufacturer of non-contact laser sensor-based measurement systems for industrial applications in Ogdensburg, New York. |
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